At Semicon West, National Instruments (NI) has recently announced the expansion of its line of PXI SMUs for automated semiconductor test. The new NI PXIe-4143 SMU offers 600,000 samples per second and four channels and expands NI's multichannel SMU output range to 24 V at 150 mA. Such features help reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of DUTs.
"With the new NI PXIe-4143, our SMU family now gives test engineers DC measurement options for almost any device. Our industry-leading channel counts, superior sample rates and SourceAdapt technology for custom tuning, provide one of the most flexible selections of semiconductor measurement instruments available," said Ron Wolfe, Vice-President, Semiconductor Test, National Instruments.
